Academic Journal
High-Resistivity Substrates in 22-nm FD-SOI—Part I: Wideband Modeling and Impact on RF Losses
| Τίτλος: | High-Resistivity Substrates in 22-nm FD-SOI—Part I: Wideband Modeling and Impact on RF Losses |
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| Συγγραφείς: | Rack, M., Lederer, D., Raskin, J. |
| Πηγή: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 72(9):5229-5235 Sep, 2025 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| FullText | Links: – Type: other Text: Availability: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: High-Resistivity Substrates in 22-nm FD-SOI—Part I: Wideband Modeling and Impact on RF Losses – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Rack%2C+M%2E%22">Rack, M.</searchLink><br /><searchLink fieldCode="AR" term="%22Lederer%2C+D%2E%22">Lederer, D.</searchLink><br /><searchLink fieldCode="AR" term="%22Raskin%2C+J%2E%22">Raskin, J.</searchLink> – Name: TitleSource Label: Source Group: Src Data: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 72(9):5229-5235 Sep, 2025 |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11114363 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/TED.2025.3594268 PhysicalDescription: Pagination: PageCount: 7 StartPage: 5229 Titles: – TitleFull: High-Resistivity Substrates in 22-nm FD-SOI—Part I: Wideband Modeling and Impact on RF Losses Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Rack, M. – PersonEntity: Name: NameFull: Lederer, D. – PersonEntity: Name: NameFull: Raskin, J. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 09 Type: published Y: 2025 Identifiers: – Type: issn-print Value: 00189383 – Type: issn-print Value: 15579646 – Type: issn-locals Value: edseee.IEEEJournals Numbering: – Type: volume Value: 72 – Type: issue Value: 9 Titles: – TitleFull: IEEE Transactions on Electron Devices, Electron Devices, IEEE Transactions on, IEEE Trans. Electron Devices Type: main |
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