Conference

Using Algorithmic Complexity Metrics for Process-Oriented Specifications

Bibliographic Details
Title: Using Algorithmic Complexity Metrics for Process-Oriented Specifications
Authors: Abramenko, Artyom, Zyubin, Vladimir
Source: 2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM) Young Professionals in Electron Devices and Materials (EDM), 2025 IEEE 26th International Conference of. :1430-1434 Jun, 2025
Relation: 2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM)
Database: IEEE Xplore Digital Library
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