Conference

Using Algorithmic Complexity Metrics for Process-Oriented Specifications

Bibliographic Details
Title: Using Algorithmic Complexity Metrics for Process-Oriented Specifications
Authors: Abramenko, Artyom, Zyubin, Vladimir
Source: 2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM) Young Professionals in Electron Devices and Materials (EDM), 2025 IEEE 26th International Conference of. :1430-1434 Jun, 2025
Relation: 2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM)
Database: IEEE Xplore Digital Library
Description
ISBN:9781665477376
ISSN:2325419X
DOI:10.1109/EDM65517.2025.11096883