Using Algorithmic Complexity Metrics for Process-Oriented Specifications

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Using Algorithmic Complexity Metrics for Process-Oriented Specifications
Συγγραφείς: Abramenko, Artyom, Zyubin, Vladimir
Πηγή: 2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM) Young Professionals in Electron Devices and Materials (EDM), 2025 IEEE 26th International Conference of. :1430-1434 Jun, 2025
Relation: 2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM)
Βάση Δεδομένων: IEEE Xplore Digital Library
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Header DbId: edseee
DbLabel: IEEE Xplore Digital Library
An: edseee.11096883
RelevancyScore: 1106
AccessLevel: 2
PubType: Conference
PubTypeId: conference
PreciseRelevancyScore: 1105.75354003906
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Using Algorithmic Complexity Metrics for Process-Oriented Specifications
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Abramenko%2C+Artyom%22">Abramenko, Artyom</searchLink><br /><searchLink fieldCode="AR" term="%22Zyubin%2C+Vladimir%22">Zyubin, Vladimir</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: 2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM) Young Professionals in Electron Devices and Materials (EDM), 2025 IEEE 26th International Conference of. :1430-1434 Jun, 2025
– Name: NoteTitleSource
  Label: Relation
  Group: SrcInfo
  Data: 2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11096883
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/EDM65517.2025.11096883
    PhysicalDescription:
      Pagination:
        PageCount: 5
        StartPage: 1430
    Titles:
      – TitleFull: Using Algorithmic Complexity Metrics for Process-Oriented Specifications
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Abramenko, Artyom
      – PersonEntity:
          Name:
            NameFull: Zyubin, Vladimir
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 27
              M: 06
              Type: published
              Y: 2025
          Identifiers:
            – Type: isbn-print
              Value: 9781665477376
            – Type: issn-print
              Value: 2325419X
            – Type: issn-locals
              Value: edseee.IEEEConferenc
          Titles:
            – TitleFull: 2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM), Young Professionals in Electron Devices and Materials (EDM), 2025 IEEE 26th International Conference of
              Type: main
ResultId 1