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Theoretical Analysis of the Effect of Pulse Time Structure on Residual Stress and Plastic Deformation During Laser Shock Processing

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Τίτλος: Theoretical Analysis of the Effect of Pulse Time Structure on Residual Stress and Plastic Deformation During Laser Shock Processing
Συγγραφείς: Shenghao, Kang, Hang, Yuan, Chengyu, Zhu, Ziqiang, Dan, Yuxin, Li
Πηγή: 2024 IEEE Academic International Symposium on Optoelectronics and Microelectronics Technology (AISOMT) Optoelectronics and Microelectronics Technology (AISOMT), 2024 IEEE Academic International Symposium on. :91-96 Nov, 2024
Relation: 2024 IEEE Academic International Symposium on Optoelectronics and Microelectronics Technology (AISOMT)
Βάση Δεδομένων: IEEE Xplore Digital Library
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An: edseee.10992045
RelevancyScore: 1089
AccessLevel: 2
PubType: Conference
PubTypeId: conference
PreciseRelevancyScore: 1088.74133300781
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Theoretical Analysis of the Effect of Pulse Time Structure on Residual Stress and Plastic Deformation During Laser Shock Processing
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Shenghao%2C+Kang%22">Shenghao, Kang</searchLink><br /><searchLink fieldCode="AR" term="%22Hang%2C+Yuan%22">Hang, Yuan</searchLink><br /><searchLink fieldCode="AR" term="%22Chengyu%2C+Zhu%22">Chengyu, Zhu</searchLink><br /><searchLink fieldCode="AR" term="%22Ziqiang%2C+Dan%22">Ziqiang, Dan</searchLink><br /><searchLink fieldCode="AR" term="%22Yuxin%2C+Li%22">Yuxin, Li</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: 2024 IEEE Academic International Symposium on Optoelectronics and Microelectronics Technology (AISOMT) Optoelectronics and Microelectronics Technology (AISOMT), 2024 IEEE Academic International Symposium on. :91-96 Nov, 2024
– Name: NoteTitleSource
  Label: Relation
  Group: SrcInfo
  Data: 2024 IEEE Academic International Symposium on Optoelectronics and Microelectronics Technology (AISOMT)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.10992045
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/AISOMT64170.2024.10992045
    PhysicalDescription:
      Pagination:
        PageCount: 6
        StartPage: 91
    Titles:
      – TitleFull: Theoretical Analysis of the Effect of Pulse Time Structure on Residual Stress and Plastic Deformation During Laser Shock Processing
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Shenghao, Kang
      – PersonEntity:
          Name:
            NameFull: Hang, Yuan
      – PersonEntity:
          Name:
            NameFull: Chengyu, Zhu
      – PersonEntity:
          Name:
            NameFull: Ziqiang, Dan
      – PersonEntity:
          Name:
            NameFull: Yuxin, Li
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 21
              M: 11
              Type: published
              Y: 2024
          Identifiers:
            – Type: isbn-print
              Value: 9798331542283
            – Type: isbn-print
              Value: 9798331542276
            – Type: issn-locals
              Value: edseee.IEEEConferenc
          Titles:
            – TitleFull: 2024 IEEE Academic International Symposium on Optoelectronics and Microelectronics Technology (AISOMT), Optoelectronics and Microelectronics Technology (AISOMT), 2024 IEEE Academic International Symposium on
              Type: main
ResultId 1