Kim, S., & Shin, H. (2025). Closed-Form Capacitance Network Compact Model and Monte Carlo Analysis of the GIDL-Assisted Potential Growth in 3-D NAND Flash String. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst., 44(11), 4438. https://doi.org/10.1109/TCAD.2025.3565473
Chicago Style (17th ed.) CitationKim, S., and H. Shin. "Closed-Form Capacitance Network Compact Model and Monte Carlo Analysis of the GIDL-Assisted Potential Growth in 3-D NAND Flash String." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 44, no. 11 (2025): 4438. https://doi.org/10.1109/TCAD.2025.3565473.
MLA (9th ed.) CitationKim, S., and H. Shin. "Closed-Form Capacitance Network Compact Model and Monte Carlo Analysis of the GIDL-Assisted Potential Growth in 3-D NAND Flash String." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst., vol. 44, no. 11, 2025, p. 4438, https://doi.org/10.1109/TCAD.2025.3565473.