Kampati, V., Bonaldo, S., Leroux, P., & Prinzie, J. (2025). Dynamic Voltage-Dependent Modeling of Single Event Transients in CMOS Ring Oscillators. IEEE Transactions on Nuclear Science, Nuclear Science, IEEE Transactions on, IEEE Trans. Nucl. Sci., 72(6), 1897. https://doi.org/10.1109/TNS.2025.3564513
Παραπομπή σε μορφή Chicago (17η εκδ.)Kampati, V.S, S. Bonaldo, P. Leroux, και J. Prinzie. "Dynamic Voltage-Dependent Modeling of Single Event Transients in CMOS Ring Oscillators." IEEE Transactions on Nuclear Science, Nuclear Science, IEEE Transactions on, IEEE Trans. Nucl. Sci. 72, no. 6 (2025): 1897. https://doi.org/10.1109/TNS.2025.3564513.
Παραπομπή σε μορφή MLA (9th εκδ.)Kampati, V.S, et al. "Dynamic Voltage-Dependent Modeling of Single Event Transients in CMOS Ring Oscillators." IEEE Transactions on Nuclear Science, Nuclear Science, IEEE Transactions on, IEEE Trans. Nucl. Sci., vol. 72, no. 6, 2025, p. 1897, https://doi.org/10.1109/TNS.2025.3564513.