Data processing, analysis and Machine Learning of Electrical Atomic Force Microscopy (AFM) in Data Cube mode: conduction of a nanomaterial for Lithium-ion battery electrodes

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Data processing, analysis and Machine Learning of Electrical Atomic Force Microscopy (AFM) in Data Cube mode: conduction of a nanomaterial for Lithium-ion battery electrodes
Συγγραφείς: Germanicus, Rosine Coq, De Wolf, Peter, Klapetek, Petr
Πηγή: 2025 IEEE 6th International Conference on Image Processing, Applications and Systems (IPAS) Image Processing, Applications and Systems (IPAS), 2025 IEEE 6th International Conference on. CFP2540Z-ART:1-5 Jan, 2025
Relation: 2025 IEEE 6th International Conference on Image Processing, Applications and Systems (IPAS)
Βάση Δεδομένων: IEEE Xplore Digital Library
FullText Text:
  Availability: 0
Header DbId: edseee
DbLabel: IEEE Xplore Digital Library
An: edseee.10924528
RelevancyScore: 1090
AccessLevel: 2
PubType: Conference
PubTypeId: conference
PreciseRelevancyScore: 1089.93664550781
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Data processing, analysis and Machine Learning of Electrical Atomic Force Microscopy (AFM) in Data Cube mode: conduction of a nanomaterial for Lithium-ion battery electrodes
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Germanicus%2C+Rosine+Coq%22">Germanicus, Rosine Coq</searchLink><br /><searchLink fieldCode="AR" term="%22De+Wolf%2C+Peter%22">De Wolf, Peter</searchLink><br /><searchLink fieldCode="AR" term="%22Klapetek%2C+Petr%22">Klapetek, Petr</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: 2025 IEEE 6th International Conference on Image Processing, Applications and Systems (IPAS) Image Processing, Applications and Systems (IPAS), 2025 IEEE 6th International Conference on. CFP2540Z-ART:1-5 Jan, 2025
– Name: NoteTitleSource
  Label: Relation
  Group: SrcInfo
  Data: 2025 IEEE 6th International Conference on Image Processing, Applications and Systems (IPAS)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.10924528
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/IPAS63548.2025.10924528
    PhysicalDescription:
      Pagination:
        PageCount: 5
        StartPage: 1
    Titles:
      – TitleFull: Data processing, analysis and Machine Learning of Electrical Atomic Force Microscopy (AFM) in Data Cube mode: conduction of a nanomaterial for Lithium-ion battery electrodes
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Germanicus, Rosine Coq
      – PersonEntity:
          Name:
            NameFull: De Wolf, Peter
      – PersonEntity:
          Name:
            NameFull: Klapetek, Petr
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 09
              M: 01
              Type: published
              Y: 2025
          Identifiers:
            – Type: isbn-print
              Value: 9798331506520
            – Type: issn-locals
              Value: edseee.IEEEConferenc
          Numbering:
            – Type: volume
              Value: CFP2540Z-ART
          Titles:
            – TitleFull: 2025 IEEE 6th International Conference on Image Processing, Applications and Systems (IPAS), Image Processing, Applications and Systems (IPAS), 2025 IEEE 6th International Conference on
              Type: main
ResultId 1