Germanicus, R. C., De Wolf, P., & Klapetek, P. (2025). Data processing, analysis and Machine Learning of Electrical Atomic Force Microscopy (AFM) in Data Cube mode: Conduction of a nanomaterial for Lithium-ion battery electrodes. 2025 IEEE 6th International Conference on Image Processing, Applications and Systems (IPAS), Image Processing, Applications and Systems (IPAS), 2025 IEEE 6th International Conference on, CFP2540Z-ART, 1. https://doi.org/10.1109/IPAS63548.2025.10924528
Παραπομπή σε μορφή Chicago (17η εκδ.)Germanicus, Rosine Coq, Peter De Wolf, και Petr Klapetek. "Data Processing, Analysis and Machine Learning of Electrical Atomic Force Microscopy (AFM) in Data Cube Mode: Conduction of a Nanomaterial for Lithium-ion Battery Electrodes." 2025 IEEE 6th International Conference on Image Processing, Applications and Systems (IPAS), Image Processing, Applications and Systems (IPAS), 2025 IEEE 6th International Conference on CFP2540Z-ART (2025): 1. https://doi.org/10.1109/IPAS63548.2025.10924528.
Παραπομπή σε μορφή MLA (9th εκδ.)Germanicus, Rosine Coq, et al. "Data Processing, Analysis and Machine Learning of Electrical Atomic Force Microscopy (AFM) in Data Cube Mode: Conduction of a Nanomaterial for Lithium-ion Battery Electrodes." 2025 IEEE 6th International Conference on Image Processing, Applications and Systems (IPAS), Image Processing, Applications and Systems (IPAS), 2025 IEEE 6th International Conference on, vol. CFP2540Z-ART, 2025, p. 1, https://doi.org/10.1109/IPAS63548.2025.10924528.