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More is Not Always Better: Exploring Early Repair of DNNs

Bibliographic Details
Title: More is Not Always Better: Exploring Early Repair of DNNs
Authors: Mancu, Andrei, Laurent, Thomas, Rieger, Franz, Arcaini, Paolo, Ishikawa, Fuyuki, Rueckert, Daniel
Source: 2024 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning (DeepTest) DEEPTEST Deep Learning for Testing and Testing for Deep Learning (DeepTest), 2024 IEEE/ACM International Workshop on. :13-16 Apr, 2024
Relation: 2024 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning (DeepTest)
Database: IEEE Xplore Digital Library
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DbLabel: IEEE Xplore Digital Library
An: edseee.10699677
RelevancyScore: 1070
AccessLevel: 2
PubType: Conference
PubTypeId: conference
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  Data: More is Not Always Better: Exploring Early Repair of DNNs
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  Data: 2024 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning (DeepTest) DEEPTEST Deep Learning for Testing and Testing for Deep Learning (DeepTest), 2024 IEEE/ACM International Workshop on. :13-16 Apr, 2024
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  Data: 2024 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning (DeepTest)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.10699677
RecordInfo BibRecord:
  BibEntity:
    PhysicalDescription:
      Pagination:
        PageCount: 4
        StartPage: 13
    Titles:
      – TitleFull: More is Not Always Better: Exploring Early Repair of DNNs
        Type: main
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      – PersonEntity:
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            NameFull: Mancu, Andrei
      – PersonEntity:
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            NameFull: Laurent, Thomas
      – PersonEntity:
          Name:
            NameFull: Rieger, Franz
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            NameFull: Arcaini, Paolo
      – PersonEntity:
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            NameFull: Ishikawa, Fuyuki
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            NameFull: Rueckert, Daniel
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          Dates:
            – D: 20
              M: 04
              Type: published
              Y: 2024
          Identifiers:
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              Value: 9798400705748
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              Value: edseee.IEEEConferenc
          Titles:
            – TitleFull: 2024 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning (DeepTest), Deep Learning for Testing and Testing for Deep Learning (DeepTest), 2024 IEEE/ACM International Workshop on, DEEPTEST
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