Mao, C., Zhu, Z., Chen, T., Towey, D., Wen, L., & Chen, J. (2025). A Two-Stage Algorithm for Identifying Software Failure Regions. IEEE Transactions on Reliability, Reliability, IEEE Transactions on, IEEE Trans. Rel., 74(2), 2693. https://doi.org/10.1109/TR.2024.3441319
Παραπομπή σε μορφή Chicago (17η εκδ.)Mao, C., Z. Zhu, T.Y Chen, D. Towey, L. Wen, και J. Chen. "A Two-Stage Algorithm for Identifying Software Failure Regions." IEEE Transactions on Reliability, Reliability, IEEE Transactions on, IEEE Trans. Rel. 74, no. 2 (2025): 2693. https://doi.org/10.1109/TR.2024.3441319.
Παραπομπή σε μορφή MLA (9th εκδ.)Mao, C., et al. "A Two-Stage Algorithm for Identifying Software Failure Regions." IEEE Transactions on Reliability, Reliability, IEEE Transactions on, IEEE Trans. Rel., vol. 74, no. 2, 2025, p. 2693, https://doi.org/10.1109/TR.2024.3441319.