A Cognitive and Metacognitive Diagnostic Assessment System: TATSUJIN Test ICT

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: A Cognitive and Metacognitive Diagnostic Assessment System: TATSUJIN Test ICT
Συγγραφείς: Yamazaki, Tomohito, Imai, Mutsumi
Πηγή: 2023 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE) Teaching, Assessment and Learning for Engineering (TALE), 2023 IEEE International Conference on. :1-6 Nov, 2023
Relation: 2023 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE)
Βάση Δεδομένων: IEEE Xplore Digital Library
Περιγραφή
ISBN:9781665453318
DOI:10.1109/TALE56641.2023.10398302