Conference
Risk Propagation Based Vector Profiling for High Coverage Dynamic IR-Drop Analysis
| Τίτλος: | Risk Propagation Based Vector Profiling for High Coverage Dynamic IR-Drop Analysis |
|---|---|
| Συγγραφείς: | Wen, Yihan, Li, Juan, Wang, Xiaoyi |
| Πηγή: | 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD) Computer Aided Design (ICCAD), 2023 IEEE/ACM International Conference on. :1-8 Oct, 2023 |
| Relation: | 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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