Wen, Y., Li, J., & Wang, X. (2023). Risk Propagation Based Vector Profiling for High Coverage Dynamic IR-Drop Analysis. 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD), Computer Aided Design (ICCAD), 2023 IEEE/ACM International Conference on, 1-8. https://doi.org/10.1109/ICCAD57390.2023.10323636
Παραπομπή σε μορφή Chicago (17η εκδ.)Wen, Yihan, Juan Li, και Xiaoyi Wang. "Risk Propagation Based Vector Profiling for High Coverage Dynamic IR-Drop Analysis." 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD), Computer Aided Design (ICCAD), 2023 IEEE/ACM International Conference on 2023: 1-8. https://doi.org/10.1109/ICCAD57390.2023.10323636.
Παραπομπή σε μορφή MLA (9th εκδ.)Wen, Yihan, et al. "Risk Propagation Based Vector Profiling for High Coverage Dynamic IR-Drop Analysis." 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD), Computer Aided Design (ICCAD), 2023 IEEE/ACM International Conference on, 2023, pp. 1-8, https://doi.org/10.1109/ICCAD57390.2023.10323636.