Mamushiane, L., Lysko, A. A., Makhosa, T., Mwangama, J., Kobo, H., Mbanga, A., & Tshimange, R. (2023). Towards Stress Testing Open5GS Core (UPF Node) On A 5G Standalone Testbed. 2023 IEEE AFRICON, AFRICON, 2023 IEEE, 1. https://doi.org/10.1109/AFRICON55910.2023.10293284
Παραπομπή σε μορφή Chicago (17η εκδ.)Mamushiane, Lusani, Albert A. Lysko, Thoriso Makhosa, Joyce Mwangama, Hlabishi Kobo, Alec Mbanga, και Rofhiwa Tshimange. "Towards Stress Testing Open5GS Core (UPF Node) On A 5G Standalone Testbed." 2023 IEEE AFRICON, AFRICON, 2023 IEEE 2023: 1. https://doi.org/10.1109/AFRICON55910.2023.10293284.
Παραπομπή σε μορφή MLA (9th εκδ.)Mamushiane, Lusani, et al. "Towards Stress Testing Open5GS Core (UPF Node) On A 5G Standalone Testbed." 2023 IEEE AFRICON, AFRICON, 2023 IEEE, 2023, p. 1, https://doi.org/10.1109/AFRICON55910.2023.10293284.