Conference
Clone Detection in IEC 61499 using Metainformation
| Τίτλος: | Clone Detection in IEC 61499 using Metainformation |
|---|---|
| Συγγραφείς: | Kutsia, Elene, Sonnleithner, Lisa, Rabiser, Rick, Zoitl, Alois |
| Πηγή: | 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA) Emerging Technologies and Factory Automation (ETFA), 2023 IEEE 28th International Conference on. :1-4 Sep, 2023 |
| Relation: | 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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