Mironov, S. E., Shiryaev, P. M., & Kaidanovich, O. Y. (2023). Models in the Process of Designing Complex Microelectronic Objects under Conditions of Uncertainty. 2023 XXVI International Conference on Soft Computing and Measurements (SCM), Soft Computing and Measurements (SCM), 2023 XXVI International Conference on, 105. https://doi.org/10.1109/SCM58628.2023.10159088
Chicago Style (17th ed.) CitationMironov, Sergey E., Pavel M. Shiryaev, and Olga Y. Kaidanovich. "Models in the Process of Designing Complex Microelectronic Objects Under Conditions of Uncertainty." 2023 XXVI International Conference on Soft Computing and Measurements (SCM), Soft Computing and Measurements (SCM), 2023 XXVI International Conference on 2023: 105. https://doi.org/10.1109/SCM58628.2023.10159088.
MLA (9th ed.) CitationMironov, Sergey E., et al. "Models in the Process of Designing Complex Microelectronic Objects Under Conditions of Uncertainty." 2023 XXVI International Conference on Soft Computing and Measurements (SCM), Soft Computing and Measurements (SCM), 2023 XXVI International Conference on, 2023, p. 105, https://doi.org/10.1109/SCM58628.2023.10159088.