Academic Journal
Evidence of Improved Thermal Stability via Nanoscale Contact Engineering in IGZO Source-Gated Thin-Film Transistors
| Τίτλος: | Evidence of Improved Thermal Stability via Nanoscale Contact Engineering in IGZO Source-Gated Thin-Film Transistors |
|---|---|
| Συγγραφείς: | Alfarisyi, S., Golec, P., Bestelink, E., Niang, K.M., Flewitt, A.J., Silva, S.R.P., Sporea, R.A. |
| Πηγή: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(7):3582-3589 Jul, 2023 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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