Conference

An analysis of widget layout attributes to support Android GUI-based testing

Bibliographic Details
Title: An analysis of widget layout attributes to support Android GUI-based testing
Authors: Fulcini, Tommaso, Coppola, Riccardo, Torchiano, Marco, Ardito, Luca
Source: 2023 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) ICSTW Software Testing, Verification and Validation Workshops (ICSTW), 2023 IEEE International Conference on. :117-125 Apr, 2023
Relation: 2023 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)
Database: IEEE Xplore Digital Library
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PubType: Conference
PubTypeId: conference
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  Data: 2023 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) ICSTW Software Testing, Verification and Validation Workshops (ICSTW), 2023 IEEE International Conference on. :117-125 Apr, 2023
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RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/ICSTW58534.2023.00033
    PhysicalDescription:
      Pagination:
        PageCount: 9
        StartPage: 117
    Titles:
      – TitleFull: An analysis of widget layout attributes to support Android GUI-based testing
        Type: main
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      – PersonEntity:
          Name:
            NameFull: Fulcini, Tommaso
      – PersonEntity:
          Name:
            NameFull: Coppola, Riccardo
      – PersonEntity:
          Name:
            NameFull: Torchiano, Marco
      – PersonEntity:
          Name:
            NameFull: Ardito, Luca
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 04
              Type: published
              Y: 2023
          Identifiers:
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              Value: 9798350333350
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            – TitleFull: 2023 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW), Software Testing, Verification and Validation Workshops (ICSTW), 2023 IEEE International Conference on, ICSTW
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