An analysis of widget layout attributes to support Android GUI-based testing

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: An analysis of widget layout attributes to support Android GUI-based testing
Συγγραφείς: Fulcini, Tommaso, Coppola, Riccardo, Torchiano, Marco, Ardito, Luca
Πηγή: 2023 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) ICSTW Software Testing, Verification and Validation Workshops (ICSTW), 2023 IEEE International Conference on. :117-125 Apr, 2023
Relation: 2023 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)
Βάση Δεδομένων: IEEE Xplore Digital Library
Περιγραφή
ISBN:9798350333350
DOI:10.1109/ICSTW58534.2023.00033