Conference
Identifying nano-Schottky diode currents in silicon diodes with 2D interfacial layers
| Τίτλος: | Identifying nano-Schottky diode currents in silicon diodes with 2D interfacial layers |
|---|---|
| Συγγραφείς: | Knezevic, Tihomir, Nanver, Lis K |
| Πηγή: | 2023 35th International Conference on Microelectronic Test Structure (ICMTS) Microelectronic Test Structure (ICMTS), 2023 35th International Conference on. :1-6 Mar, 2023 |
| Relation: | 2023 35th International Conference on Microelectronic Test Structure (ICMTS) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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