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Identifying nano-Schottky diode currents in silicon diodes with 2D interfacial layers

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Τίτλος: Identifying nano-Schottky diode currents in silicon diodes with 2D interfacial layers
Συγγραφείς: Knezevic, Tihomir, Nanver, Lis K
Πηγή: 2023 35th International Conference on Microelectronic Test Structure (ICMTS) Microelectronic Test Structure (ICMTS), 2023 35th International Conference on. :1-6 Mar, 2023
Relation: 2023 35th International Conference on Microelectronic Test Structure (ICMTS)
Βάση Δεδομένων: IEEE Xplore Digital Library
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        Value: 10.1109/ICMTS55420.2023.10094164
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              Y: 2023
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