Knezevic, T., & Nanver, L. K. (2023). Identifying nano-Schottky diode currents in silicon diodes with 2D interfacial layers. 2023 35th International Conference on Microelectronic Test Structure (ICMTS), Microelectronic Test Structure (ICMTS), 2023 35th International Conference on, 1. https://doi.org/10.1109/ICMTS55420.2023.10094164
Παραπομπή σε μορφή Chicago (17η εκδ.)Knezevic, Tihomir, και Lis K. Nanver. "Identifying Nano-Schottky Diode Currents in Silicon Diodes with 2D Interfacial Layers." 2023 35th International Conference on Microelectronic Test Structure (ICMTS), Microelectronic Test Structure (ICMTS), 2023 35th International Conference on 2023: 1. https://doi.org/10.1109/ICMTS55420.2023.10094164.
Παραπομπή σε μορφή MLA (9th εκδ.)Knezevic, Tihomir, και Lis K. Nanver. "Identifying Nano-Schottky Diode Currents in Silicon Diodes with 2D Interfacial Layers." 2023 35th International Conference on Microelectronic Test Structure (ICMTS), Microelectronic Test Structure (ICMTS), 2023 35th International Conference on, 2023, p. 1, https://doi.org/10.1109/ICMTS55420.2023.10094164.