Conference
Test Flimsiness: Characterizing Flakiness Induced by Mutation to the Code Under Test
| Τίτλος: | Test Flimsiness: Characterizing Flakiness Induced by Mutation to the Code Under Test |
|---|---|
| Συγγραφείς: | Parry, Owain, Kapfhammer, Gregory M., Hilton, Michael, McMinn, Phil |
| Πηγή: | Proceedings of the 2026 IEEE/ACM 48th International Conference on Software Engineering. :3195-3206 |
| Διαθεσιμότητα: | http://dl.acm.org/doi/10.1145/3744916.3773125 |
| Βάση Δεδομένων: | ACM Full-Text Collection |
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