APA (7th ed.) Citation

Parry, O., Kapfhammer, G. M., Hilton, M., & McMinn, P. (2026). Test Flimsiness: Characterizing Flakiness Induced by Mutation to the Code Under Test. Proceedings of the 2026 IEEE/ACM 48th International Conference on Software Engineering, 3195. https://doi.org/10.1145/3744916.3773125

Chicago Style (17th ed.) Citation

Parry, Owain, Gregory M. Kapfhammer, Michael Hilton, and Phil McMinn. "Test Flimsiness: Characterizing Flakiness Induced by Mutation to the Code Under Test." Proceedings of the 2026 IEEE/ACM 48th International Conference on Software Engineering 2026: 3195. https://doi.org/10.1145/3744916.3773125.

MLA (9th ed.) Citation

Parry, Owain, et al. "Test Flimsiness: Characterizing Flakiness Induced by Mutation to the Code Under Test." Proceedings of the 2026 IEEE/ACM 48th International Conference on Software Engineering, 2026, p. 3195, https://doi.org/10.1145/3744916.3773125.