Παραπομπή σε μορφή APA (7η εκδ.)

Liu, T. (2018). Multivariate Adaptive Regression Splines in Standard Cell Characterization for Nanometer Technology in Semiconductor. MODID-6d55e02e354:IntechOpen. https://doi.org/10.5772/intechopen.74854

Παραπομπή σε μορφή Chicago (17η εκδ.)

Liu, Taizhi. "Multivariate Adaptive Regression Splines in Standard Cell Characterization for Nanometer Technology in Semiconductor." MODID-6d55e02e354:IntechOpen 2018. https://doi.org/10.5772/intechopen.74854.

Παραπομπή σε μορφή MLA (9th εκδ.)

Liu, Taizhi. "Multivariate Adaptive Regression Splines in Standard Cell Characterization for Nanometer Technology in Semiconductor." MODID-6d55e02e354:IntechOpen, 2018, https://doi.org/10.5772/intechopen.74854.