Παραπομπή σε μορφή APA (7η εκδ.)

Wang, X., & Kwong, D. (2005). A novel high-K SONOS type non-volatile memory and NMOS HfO₂ Vth instability studies for gate electrode and interface threatment effects.

Παραπομπή σε μορφή Chicago (17η εκδ.)

Wang, Xuguang, και Dim-Lee Kwong. A Novel High-K SONOS Type Non-volatile Memory and NMOS HfO₂ Vth Instability Studies for Gate Electrode and Interface Threatment Effects. 2005.

Παραπομπή σε μορφή MLA (9th εκδ.)

Wang, Xuguang, και Dim-Lee Kwong. A Novel High-K SONOS Type Non-volatile Memory and NMOS HfO₂ Vth Instability Studies for Gate Electrode and Interface Threatment Effects. 2005.