Dissertation/Thesis
An Optimal Algorithm for Detecting Pattern Sensitive Faults in Semiconductor Random Access Memories
| Τίτλος: | An Optimal Algorithm for Detecting Pattern Sensitive Faults in Semiconductor Random Access Memories |
|---|---|
| Συγγραφείς: | Subrin, Richard I. |
| Πηγή: | Retrospective Theses and Dissertations |
| Στοιχεία εκδότη: | STARS |
| Έτος έκδοσης: | 1981 |
| Συλλογή: | University of Central Florida (UCF): STARS (Showcase of Text, Archives, Research & Scholarship) |
| Θεματικοί όροι: | Pattern recognition systems, Random access memory, Adjacent-pattern interference faults (APIFs), Pattern-sensitive faults, Optimal test algorithm, Memory operation minimization, RAM test sequence model, Engineering |
| Περιγραφή: | Random-access memory (RAM) testing to detect unrestricted pattern-sensitive faults (PSFs) is impractical due to the size of the memory checking sequence required. A formal model for restricted PSFs in RAMs called adjacent-pattern interference faults (APIFs) is presented. A test algorithm capable of detecting APIFs in RAMs requiring a minimum number of memory operations is then developed. |
| Τύπος εγγράφου: | Thesis |
| Περιγραφή αρχείου: | application/pdf |
| Γλώσσα: | English |
| Relation: | https://stars.library.ucf.edu/rtd/596; https://stars.library.ucf.edu/context/rtd/article/1595/viewcontent/68456.pdf |
| Διαθεσιμότητα: | https://stars.library.ucf.edu/rtd/596 https://stars.library.ucf.edu/context/rtd/article/1595/viewcontent/68456.pdf |
| Rights: | Public Domain |
| Αριθμός Καταχώρησης: | edsbas.67CC5C0 |
| Βάση Δεδομένων: | BASE |
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