Dissertation/Thesis
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An Optimal Algorithm for Detecting Pattern Sensitive Faults in Semiconductor Random Access Memories

Bibliographic Details
Title: An Optimal Algorithm for Detecting Pattern Sensitive Faults in Semiconductor Random Access Memories
Authors: Subrin, Richard I.
Source: Retrospective Theses and Dissertations
Publisher Information: STARS
Publication Year: 1981
Collection: University of Central Florida (UCF): STARS (Showcase of Text, Archives, Research & Scholarship)
Subject Terms: Pattern recognition systems, Random access memory, Adjacent-pattern interference faults (APIFs), Pattern-sensitive faults, Optimal test algorithm, Memory operation minimization, RAM test sequence model, Engineering
Description: Random-access memory (RAM) testing to detect unrestricted pattern-sensitive faults (PSFs) is impractical due to the size of the memory checking sequence required. A formal model for restricted PSFs in RAMs called adjacent-pattern interference faults (APIFs) is presented. A test algorithm capable of detecting APIFs in RAMs requiring a minimum number of memory operations is then developed.
Document Type: Thesis
File Description: application/pdf
Language: English
Relation: https://stars.library.ucf.edu/rtd/596; https://stars.library.ucf.edu/context/rtd/article/1595/viewcontent/68456.pdf
Availability: https://stars.library.ucf.edu/rtd/596
https://stars.library.ucf.edu/context/rtd/article/1595/viewcontent/68456.pdf
Rights: Public Domain
Accession Number: edsbas.67CC5C0
Database: BASE
FullText Text:
  Availability: 0
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  – Url: https://stars.library.ucf.edu/rtd/596#
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PubType: Dissertation/Thesis
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PreciseRelevancyScore: 675.149597167969
IllustrationInfo
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  Label: Title
  Group: Ti
  Data: An Optimal Algorithm for Detecting Pattern Sensitive Faults in Semiconductor Random Access Memories
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Subrin%2C+Richard+I%2E%22">Subrin, Richard I.</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: Retrospective Theses and Dissertations
– Name: Publisher
  Label: Publisher Information
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  Data: STARS
– Name: DatePubCY
  Label: Publication Year
  Group: Date
  Data: 1981
– Name: Subset
  Label: Collection
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  Data: University of Central Florida (UCF): STARS (Showcase of Text, Archives, Research & Scholarship)
– Name: Subject
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  Data: <searchLink fieldCode="DE" term="%22Pattern+recognition+systems%22">Pattern recognition systems</searchLink><br /><searchLink fieldCode="DE" term="%22Random+access+memory%22">Random access memory</searchLink><br /><searchLink fieldCode="DE" term="%22Adjacent-pattern+interference+faults+%28APIFs%29%22">Adjacent-pattern interference faults (APIFs)</searchLink><br /><searchLink fieldCode="DE" term="%22Pattern-sensitive+faults%22">Pattern-sensitive faults</searchLink><br /><searchLink fieldCode="DE" term="%22Optimal+test+algorithm%22">Optimal test algorithm</searchLink><br /><searchLink fieldCode="DE" term="%22Memory+operation+minimization%22">Memory operation minimization</searchLink><br /><searchLink fieldCode="DE" term="%22RAM+test+sequence+model%22">RAM test sequence model</searchLink><br /><searchLink fieldCode="DE" term="%22Engineering%22">Engineering</searchLink>
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  Label: Description
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  Data: Random-access memory (RAM) testing to detect unrestricted pattern-sensitive faults (PSFs) is impractical due to the size of the memory checking sequence required. A formal model for restricted PSFs in RAMs called adjacent-pattern interference faults (APIFs) is presented. A test algorithm capable of detecting APIFs in RAMs requiring a minimum number of memory operations is then developed.
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    Languages:
      – Text: English
    Subjects:
      – SubjectFull: Pattern recognition systems
        Type: general
      – SubjectFull: Random access memory
        Type: general
      – SubjectFull: Adjacent-pattern interference faults (APIFs)
        Type: general
      – SubjectFull: Pattern-sensitive faults
        Type: general
      – SubjectFull: Optimal test algorithm
        Type: general
      – SubjectFull: Memory operation minimization
        Type: general
      – SubjectFull: RAM test sequence model
        Type: general
      – SubjectFull: Engineering
        Type: general
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              M: 01
              Type: published
              Y: 1981
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            – TitleFull: Retrospective Theses and Dissertations
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