Vargas Castrillon, C., Kim, K., Coletti, G., Payne, D., Chan, C., Wenham, S., . . . Kim, K. (2017). Influence of silicon nitride and its hydrogen content on carrier-induced degradation in multicrystalline silicon wafer. urn:ISSN:2196-100X ; 33rd European Photovoltaic Solar Energy Conference, Amsterdam, 2017-09-25 - 2017-09-29. https://doi.org/10.26190/unsworks/27055
Παραπομπή σε μορφή Chicago (17η εκδ.)Vargas Castrillon, C., K. Kim, G. Coletti, D. Payne, C. Chan, S. Wenham, Z. Hameiri, και Kyung Kim. "Influence of Silicon Nitride and Its Hydrogen Content on Carrier-induced Degradation in Multicrystalline Silicon Wafer." Urn:ISSN:2196-100X ; 33rd European Photovoltaic Solar Energy Conference, Amsterdam, 2017-09-25 - 2017-09-29 2017. https://doi.org/10.26190/unsworks/27055.
Παραπομπή σε μορφή MLA (9th εκδ.)Vargas Castrillon, C., et al. "Influence of Silicon Nitride and Its Hydrogen Content on Carrier-induced Degradation in Multicrystalline Silicon Wafer." Urn:ISSN:2196-100X ; 33rd European Photovoltaic Solar Energy Conference, Amsterdam, 2017-09-25 - 2017-09-29, 2017, https://doi.org/10.26190/unsworks/27055.