Dissertation/ Thesis
Simulation of defectoscopic X-ray television systems for non-destructive testing of semiconductor materials
| Τίτλος: | Simulation of defectoscopic X-ray television systems for non-destructive testing of semiconductor materials |
|---|---|
| Συγγραφείς: | Slobodian, Nina |
| Συνεισφορές: | Denbnovetsky, Stanislav, ELAKPI |
| Στοιχεία εκδότη: | National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”, 2007. |
| Έτος έκδοσης: | 2007 |
| Θεματικοί όροι: | CCD-matrix, semiconductor materials, X-ray television system, non-destructive testing, рентгенотелевізійна система, неруйнівний контроль, рентгеновідикон, напівпровідникові матеріали, simulation, X-ray vidicon, ПЗЗ-матриця, моделювання |
| Περιγραφή: | The work is devoted to increasing effectiveness of X-ray television systems for non-destructive testing on base of selecting by simulation the most profitable functioning regimes of X-ray-electrical signal converter unit for testing of the semiconductor materials. The method of selecting the most profitable X-ray apparatus regime is proposed. The simulation of radiation generation from pulse X-ray tubes is performed. For small-signal approach the end-to-end model of X-ray-electrical signal unit with X-ray vidicon by means of linear digital non-recursive filter is made. The digital non-linear model of such unit is implemented. The end-to-end model of converter with CCD-matrix is developed and applied. Good correspondence between the results obtained in the framework of proposed model and by performed experiments is achieved. |
| Τύπος εγγράφου: | Thesis |
| Περιγραφή αρχείου: | application/pdf |
| Γλώσσα: | English |
| Σύνδεσμος πρόσβασης: | https://ela.kpi.ua/handle/123456789/61711 |
| Αριθμός Καταχώρησης: | edsair.od......2635..e103e5ab48fb06f16f3f3ba7a88aa93b |
| Βάση Δεδομένων: | OpenAIRE |
καταχωρήστε σχόλιο πρώτοι!