Slobodian, N., Denbnovetsky, S., & ELAKPI. (2007). Simulation of defectoscopic X-ray television systems for non-destructive testing of semiconductor materials.
Chicago Style (17th ed.) CitationSlobodian, Nina, Stanislav Denbnovetsky, and ELAKPI. Simulation of Defectoscopic X-ray Television Systems for Non-destructive Testing of Semiconductor Materials. 2007.
MLA (9th ed.) CitationSlobodian, Nina, et al. Simulation of Defectoscopic X-ray Television Systems for Non-destructive Testing of Semiconductor Materials. 2007.
Warning: These citations may not always be 100% accurate.