Slobodian, N., Denbnovetsky, S., & ELAKPI. (2007). Simulation of defectoscopic X-ray television systems for non-destructive testing of semiconductor materials.
Παραπομπή σε μορφή Chicago (17η εκδ.)Slobodian, Nina, Stanislav Denbnovetsky, και ELAKPI. Simulation of Defectoscopic X-ray Television Systems for Non-destructive Testing of Semiconductor Materials. 2007.
Παραπομπή σε μορφή MLA (9th εκδ.)Slobodian, Nina, et al. Simulation of Defectoscopic X-ray Television Systems for Non-destructive Testing of Semiconductor Materials. 2007.
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