Academic Journal
Spatially and frequency-resolved monitoring of intradie capacitive coupling by heterodyne excitation infrared lock-in thermography
| Title: | Spatially and frequency-resolved monitoring of intradie capacitive coupling by heterodyne excitation infrared lock-in thermography |
|---|---|
| Authors: | León, J., Perpiñà, Xavier, Altet Sanahujes, Josep, Vallvehi, Miquel, Jordà, Xavier |
| Contributors: | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica, Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
| Source: | UPCommons. Portal del coneixement obert de la UPC Universitat Politècnica de Catalunya (UPC) Recercat. Dipósit de la Recerca de Catalunya instname |
| Publisher Information: | AIP Publishing, 2013. |
| Publication Year: | 2013 |
| Subject Terms: | Capacitive couplings, Electrical characteristic, Lockin thermography, Infrared imaging, Capacitive currents, Electrical signal, Excitation technique, Heat sources, Enginyeria electrònica::Microelectrònica::Circuits integrats [Àrees temàtiques de la UPC], 02 engineering and technology, 01 natural sciences, Electrical coupling, High frequency HF, Espectre infraroig, Drive devices, High frequency, Micro-electronic devices, Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats, 0103 physical sciences, 0210 nano-technology |
| Description: | This paper combines the infrared lock-in thermography (IR-LIT) and heterodyne excitation techniques to detect high-frequency capacitive currents due to intradie electrical coupling between microelectronic devices or more complex systems. Modulating the excitation with the heterodyne approach, we drive devices or complex systems with high frequency electrical signals in such a way that they behave as low frequency heat sources, modulating their temperature field at a frequency detectable by an IR-LIT system. This approach is analytically studied and extended to a bi-dimensional scenario, showing that the thermal information at low frequency depends on the electrical characteristics of the sample at high frequency. |
| Document Type: | Article |
| File Description: | application/pdf |
| Language: | English |
| ISSN: | 1077-3118 0003-6951 |
| DOI: | 10.1063/1.4790299 |
| Access URL: | http://hdl.handle.net/2117/18806 https://core.ac.uk/display/41770748 https://aip.scitation.org/doi/full/10.1063/1.4790299 https://upcommons.upc.edu/handle/2117/18806 https://scitation.aip.org/content/aip/journal/apl/102/5/10.1063/1.4790299 http://ui.adsabs.harvard.edu/abs/2013ApPhL.102e4103L/abstract |
| Accession Number: | edsair.doi.dedup.....bc4d988d6825632a6593a75e3d0f9ca8 |
| Database: | OpenAIRE |
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