Academic Journal

A Model Checking-Based Method of Functional Test Generation for HDL Descriptions

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: A Model Checking-Based Method of Functional Test Generation for HDL Descriptions
Συγγραφείς: LEBEDEV M.S., SMOLOV S.A.
Πηγή: Труды Института системного программирования РАН, Vol 28, Iss 4, Pp 41-56 (2018)
Στοιχεία εκδότη: Institute for System Programming of the Russian Academy of Sciences, 2016.
Έτος έκδοσης: 2016
Θεματικοί όροι: охраняемое действие, расширенный конечный автомат, статический анализ, функциональная верификация, Electronic computers. Computer science, генерация тестов, цифровая аппаратура, QA75.5-76.95, HARDWARE DESIGN,FUNCTIONAL VERIFICATION,STATIC ANALYSIS,TEST GENERATION,GUARDED ACTION,HIGH-LEVEL DECISION DIAGRAM,EXTENDED FINITE STATE MACHINE,MODEL CHECKING,ЦИФРОВАЯ АППАРАТУРА,ФУНКЦИОНАЛЬНАЯ ВЕРИФИКАЦИЯ,СТАТИЧЕСКИЙ АНАЛИЗ,ГЕНЕРАЦИЯ ТЕСТОВ,ОХРАНЯЕМОЕ ДЕЙСТВИЕ,ВЫСОКОУРОВНЕВАЯ РЕШАЮЩАЯ ДИАГРАММА,РАСШИРЕННЫЙ КОНЕЧНЫЙ АВТОМАТ,ПРОВЕРКА МОДЕЛИ, высокоуровневая решающая диаграмма, проверка модели
Περιγραφή: Automated test generation is a promising direction in hardware verification research area. Functional test generation methods based on models are widespread at the moment. In this paper, a functional test generation method based on model checking is proposed and compared to existing solutions. Automated model extraction from the hardware design’s source code is used. Supported HDLs include VHDL and Verilog. Several kinds of models are used at different steps of the test generation method: guarded action decision diagram (GADD), high-level decision diagram (HLDD) and extended finite-state machine (EFSM). The high-level decision diagram model (which is extracted from the GADD model) is used as a functional model. The extended finite-state machine model is used as a coverage model. The aim of test generation is to cover all the transitions of the extended finite state machine model. Such criterion leads to the high HDL source code coverage. Specifications based on transition and state constraints of the EFSM are extracted for this purpose. Later, the functional model and the specifications are automatically translated into the input format of the nuXmv model checking tool. nuXmv performs model checking and generates counterexamples. These counterexamples are translated to functional tests that can be simulated by the HDL simulator. The proposed method has been implemented as a part of the HDL Retrascope framework. Experiments show that the method can generate shorter tests than the FATE and RETGA methods providing the same or better source code coverage.
Τύπος εγγράφου: Article
Other literature type
Περιγραφή αρχείου: text/html
ISSN: 2220-6426
2079-8156
DOI: 10.15514/ispras-2016-28(4)-3
Σύνδεσμος πρόσβασης: http://ispras.ru/proceedings/docs/2016/28/4/isp_28_2016_4_41.pdf
https://doaj.org/article/db5cd6bc2a3c4fd88d1b58c262c5cfae
https://ispranproceedings.elpub.ru/jour/article/download/138/75
https://doaj.org/article/db5cd6bc2a3c4fd88d1b58c262c5cfae
https://ispranproceedings.elpub.ru/jour/article/view/138
https://cyberleninka.ru/article/n/a-model-checking-based-method-of-functional-test-generation-for-hdl-descriptions
https://www.ispras.ru/en/proceedings/isp_28_2016_4/isp_28_2016_4_41/
https://cyberleninka.ru/article/n/a-model-checking-based-method-of-functional-test-generation-for-hdl-descriptions/pdf
http://cyberleninka.ru/article_covers/16937636.png
http://cyberleninka.ru/article/n/a-model-checking-based-method-of-functional-test-generation-for-hdl-descriptions
Rights: CC BY
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  Data: A Model Checking-Based Method of Functional Test Generation for HDL Descriptions
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  Data: <searchLink fieldCode="AR" term="%22LEBEDEV+M%2ES%2E%22">LEBEDEV M.S.</searchLink><br /><searchLink fieldCode="AR" term="%22SMOLOV+S%2EA%2E%22">SMOLOV S.A.</searchLink>
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  Data: Труды Института системного программирования РАН, Vol 28, Iss 4, Pp 41-56 (2018)
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  Data: <searchLink fieldCode="DE" term="%22охраняемое+действие%22">охраняемое действие</searchLink><br /><searchLink fieldCode="DE" term="%22расширенный+конечный+автомат%22">расширенный конечный автомат</searchLink><br /><searchLink fieldCode="DE" term="%22статический+анализ%22">статический анализ</searchLink><br /><searchLink fieldCode="DE" term="%22функциональная+верификация%22">функциональная верификация</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+computers%2E+Computer+science%22">Electronic computers. Computer science</searchLink><br /><searchLink fieldCode="DE" term="%22генерация+тестов%22">генерация тестов</searchLink><br /><searchLink fieldCode="DE" term="%22цифровая+аппаратура%22">цифровая аппаратура</searchLink><br /><searchLink fieldCode="DE" term="%22QA75%2E5-76%2E95%22">QA75.5-76.95</searchLink><br /><searchLink fieldCode="DE" term="%22HARDWARE+DESIGN%2CFUNCTIONAL+VERIFICATION%2CSTATIC+ANALYSIS%2CTEST+GENERATION%2CGUARDED+ACTION%2CHIGH-LEVEL+DECISION+DIAGRAM%2CEXTENDED+FINITE+STATE+MACHINE%2CMODEL+CHECKING%2CЦИФРОВАЯ+АППАРАТУРА%2CФУНКЦИОНАЛЬНАЯ+ВЕРИФИКАЦИЯ%2CСТАТИЧЕСКИЙ+АНАЛИЗ%2CГЕНЕРАЦИЯ+ТЕСТОВ%2CОХРАНЯЕМОЕ+ДЕЙСТВИЕ%2CВЫСОКОУРОВНЕВАЯ+РЕШАЮЩАЯ+ДИАГРАММА%2CРАСШИРЕННЫЙ+КОНЕЧНЫЙ+АВТОМАТ%2CПРОВЕРКА+МОДЕЛИ%22">HARDWARE DESIGN,FUNCTIONAL VERIFICATION,STATIC ANALYSIS,TEST GENERATION,GUARDED ACTION,HIGH-LEVEL DECISION DIAGRAM,EXTENDED FINITE STATE MACHINE,MODEL CHECKING,ЦИФРОВАЯ АППАРАТУРА,ФУНКЦИОНАЛЬНАЯ ВЕРИФИКАЦИЯ,СТАТИЧЕСКИЙ АНАЛИЗ,ГЕНЕРАЦИЯ ТЕСТОВ,ОХРАНЯЕМОЕ ДЕЙСТВИЕ,ВЫСОКОУРОВНЕВАЯ РЕШАЮЩАЯ ДИАГРАММА,РАСШИРЕННЫЙ КОНЕЧНЫЙ АВТОМАТ,ПРОВЕРКА МОДЕЛИ</searchLink><br /><searchLink fieldCode="DE" term="%22высокоуровневая+решающая+диаграмма%22">высокоуровневая решающая диаграмма</searchLink><br /><searchLink fieldCode="DE" term="%22проверка+модели%22">проверка модели</searchLink>
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  Data: Automated test generation is a promising direction in hardware verification research area. Functional test generation methods based on models are widespread at the moment. In this paper, a functional test generation method based on model checking is proposed and compared to existing solutions. Automated model extraction from the hardware design’s source code is used. Supported HDLs include VHDL and Verilog. Several kinds of models are used at different steps of the test generation method: guarded action decision diagram (GADD), high-level decision diagram (HLDD) and extended finite-state machine (EFSM). The high-level decision diagram model (which is extracted from the GADD model) is used as a functional model. The extended finite-state machine model is used as a coverage model. The aim of test generation is to cover all the transitions of the extended finite state machine model. Such criterion leads to the high HDL source code coverage. Specifications based on transition and state constraints of the EFSM are extracted for this purpose. Later, the functional model and the specifications are automatically translated into the input format of the nuXmv model checking tool. nuXmv performs model checking and generates counterexamples. These counterexamples are translated to functional tests that can be simulated by the HDL simulator. The proposed method has been implemented as a part of the HDL Retrascope framework. Experiments show that the method can generate shorter tests than the FATE and RETGA methods providing the same or better source code coverage.
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      – TitleFull: A Model Checking-Based Method of Functional Test Generation for HDL Descriptions
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