A Quantitative Characterization of Cross Coverage

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος:	A Quantitative Characterization of Cross Coverage
Συγγραφείς:	Jiantao Zhou, Caihe Lan, William N. N. Hung, Xinrui Guo, Xiaoyu Song
Πηγή:	IEEE Transactions on Computers. 64:2408-2414
Στοιχεία εκδότη:	Institute of Electrical and Electronics Engineers (IEEE), 2015.
Έτος έκδοσης:	2015
Θεματικοί όροι:	Engineering -- Statistical methods, Probabilities, Debugging in computer science, 0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology, Electrical and Computer Engineering
Περιγραφή:	Effective verification methods are necessary for finding bugs in complex system design. Given domain specific knowledge, design verification engineers typically specify cross coverage for certain risky areas where bugs tend to appear. This paper proposes a pragmatic coverage model based on cross coverage. We address the verification on user specified cross coverage regions. The proposed analysis models the probability of exposing the bug within a given number of samplings, and derives the expected number of samples until bug detection. The approach is applicable to random, round-robin, and hybrid sampling strategies in recurring and nonrecurring cases based on our cross coverage model. We have written Matlab and C programs that use our formulas to calculate the probabilities. Experimental results show that our analysis is consistent with Monte Carlo simulation.
Τύπος εγγράφου:	Article
ISSN:	0018-9340
DOI:	10.1109/tc.2014.2360540
Σύνδεσμος πρόσβασης:	https://www.computer.org/csdl/trans/tc/2015/08/06911941.pdf https://ieeexplore.ieee.org/document/6911941/ https://pdxscholar.library.pdx.edu/ece_fac/304/ https://www.computer.org/csdl/trans/tc/2015/08/06911941.html http://ieeexplore.ieee.org/document/6911941/ https://dblp.uni-trier.de/db/journals/tc/tc64.html#ZhouLHGS15
Rights:	IEEE Copyright
Αριθμός Καταχώρησης:	edsair.doi.dedup.....7a0e5dcaaa6c8b8c6bed9c20d8306e6c
Βάση Δεδομένων:	OpenAIRE

Περιγραφή
ISSN:	00189340
DOI:	10.1109/tc.2014.2360540