Academic Journal

Investigating Oxide Material and Thickness Effects on Key Performance Parameters of Dual Source Vertical TFET

Bibliographic Details
Title: Investigating Oxide Material and Thickness Effects on Key Performance Parameters of Dual Source Vertical TFET
Authors: Aamina Jalal, Dharmendra Kumar Jhariya, Manish Verma
Source: 2024 12th International Conference on Internet of Everything, Microwave, Embedded, Communication and Networks (IEMECON). :1-5
Publisher Information: IEEE, 2024.
Publication Year: 2024
Document Type: Article
DOI: 10.1109/iemecon62401.2024.10845981
Rights: STM Policy #29
Accession Number: edsair.doi...........ccabb4dfcda4c5b53bc47286b6de625d
Database: OpenAIRE
Description
DOI:10.1109/iemecon62401.2024.10845981