Jalal, A., Jhariya, D. K., & Verma, M. (2024). Investigating Oxide Material and Thickness Effects on Key Performance Parameters of Dual Source Vertical TFET. 2024 12th International Conference on Internet of Everything, Microwave, Embedded, Communication and Networks (IEMECON), 1. https://doi.org/10.1109/iemecon62401.2024.10845981
Chicago Style (17th ed.) CitationJalal, Aamina, Dharmendra Kumar Jhariya, and Manish Verma. "Investigating Oxide Material and Thickness Effects on Key Performance Parameters of Dual Source Vertical TFET." 2024 12th International Conference on Internet of Everything, Microwave, Embedded, Communication and Networks (IEMECON) 2024: 1. https://doi.org/10.1109/iemecon62401.2024.10845981.
MLA (9th ed.) CitationJalal, Aamina, et al. "Investigating Oxide Material and Thickness Effects on Key Performance Parameters of Dual Source Vertical TFET." 2024 12th International Conference on Internet of Everything, Microwave, Embedded, Communication and Networks (IEMECON), 2024, p. 1, https://doi.org/10.1109/iemecon62401.2024.10845981.