Academic Journal
An Improved Steep-Slope Triple Metal Gate-Dual Dielectric-GaAs-Pocket-HTFET With Interface Trap Charges Analysis
| Title: | An Improved Steep-Slope Triple Metal Gate-Dual Dielectric-GaAs-Pocket-HTFET With Interface Trap Charges Analysis |
|---|---|
| Authors: | Madhulika Verma, Ankita Singh, Sachin Agrawal |
| Source: | IEEE Transactions on Device and Materials Reliability. 25:668-676 |
| Publisher Information: | Institute of Electrical and Electronics Engineers (IEEE), 2025. |
| Publication Year: | 2025 |
| Document Type: | Article |
| ISSN: | 1558-2574 1530-4388 |
| DOI: | 10.1109/tdmr.2025.3595573 |
| Rights: | IEEE Copyright |
| Accession Number: | edsair.doi...........a166c92ce28d7800eb0979b2f6eb39ef |
| Database: | OpenAIRE |
| ISSN: | 15582574 15304388 |
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| DOI: | 10.1109/tdmr.2025.3595573 |