S, S., Das, S., Ravindra, M., & Mukherjee, D. (2024). Edge Response and Defect Detectability in Flat Panel Digital Radiography. Materials Evaluation, 82, 51. https://doi.org/10.32548/2024.me-04372
Chicago Style (17th ed.) CitationS, Srivathasan, Sanjoy Das, M. Ravindra, and D. Mukherjee. "Edge Response and Defect Detectability in Flat Panel Digital Radiography." Materials Evaluation 82 (2024): 51. https://doi.org/10.32548/2024.me-04372.
MLA (9th ed.) CitationS, Srivathasan, et al. "Edge Response and Defect Detectability in Flat Panel Digital Radiography." Materials Evaluation, vol. 82, 2024, p. 51, https://doi.org/10.32548/2024.me-04372.
Warning: These citations may not always be 100% accurate.