Παραπομπή σε μορφή APA (7η εκδ.)

S, S., Das, S., Ravindra, M., & Mukherjee, D. (2024). Edge Response and Defect Detectability in Flat Panel Digital Radiography. Materials Evaluation, 82, 51. https://doi.org/10.32548/2024.me-04372

Παραπομπή σε μορφή Chicago (17η εκδ.)

S, Srivathasan, Sanjoy Das, M. Ravindra, και D. Mukherjee. "Edge Response and Defect Detectability in Flat Panel Digital Radiography." Materials Evaluation 82 (2024): 51. https://doi.org/10.32548/2024.me-04372.

Παραπομπή σε μορφή MLA (9th εκδ.)

S, Srivathasan, et al. "Edge Response and Defect Detectability in Flat Panel Digital Radiography." Materials Evaluation, vol. 82, 2024, p. 51, https://doi.org/10.32548/2024.me-04372.