Academic Journal
Concurrent error detection and fault-tolerance in linear analog circuits using continuous checksums.
| Τίτλος: | Concurrent error detection and fault-tolerance in linear analog circuits using continuous checksums. |
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| Συγγραφείς: | Chatterjee, A. |
| Πηγή: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems; 1993, Vol. 1 Issue 2, p138-150, 13p |
| Βάση Δεδομένων: | Complementary Index |
| FullText | Text: Availability: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edb&AN=92806478 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/92.238422 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 13 StartPage: 138 Titles: – TitleFull: Concurrent error detection and fault-tolerance in linear analog circuits using continuous checksums. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Chatterjee, A. IsPartOfRelationships: – BibEntity: Dates: – D: 02 M: 03 Text: 1993 Type: published Y: 1993 Identifiers: – Type: issn-print Value: 10638210 Numbering: – Type: volume Value: 1 – Type: issue Value: 2 Titles: – TitleFull: IEEE Transactions on Very Large Scale Integration (VLSI) Systems Type: main |
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