Conference
Electrical equivalent method for thermal stress analysis.
| Τίτλος: | Electrical equivalent method for thermal stress analysis. |
|---|---|
| Συγγραφείς: | Riemer, D.E. |
| Πηγή: | Proceedings, 39th Electronic Components Conference; 1989, p869-874, 6p |
| Βάση Δεδομένων: | Complementary Index |
| FullText | Text: Availability: 0 |
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| Header | DbId: edb DbLabel: Complementary Index An: 92343414 RelevancyScore: 834 AccessLevel: 6 PubType: Conference PubTypeId: conference PreciseRelevancyScore: 833.93701171875 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edb&AN=92343414 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/ECC.1989.77847 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 6 StartPage: 869 Titles: – TitleFull: Electrical equivalent method for thermal stress analysis. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Riemer, D.E. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 01 Text: 1989 Type: published Y: 1989 Titles: – TitleFull: Proceedings, 39th Electronic Components Conference Type: main |
| ResultId | 1 |