Electrical equivalent method for thermal stress analysis.

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Electrical equivalent method for thermal stress analysis.
Συγγραφείς: Riemer, D.E.
Πηγή: Proceedings, 39th Electronic Components Conference; 1989, p869-874, 6p
Βάση Δεδομένων: Complementary Index
FullText Text:
  Availability: 0
Header DbId: edb
DbLabel: Complementary Index
An: 92343414
RelevancyScore: 834
AccessLevel: 6
PubType: Conference
PubTypeId: conference
PreciseRelevancyScore: 833.93701171875
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Electrical equivalent method for thermal stress analysis.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Riemer%2C+D%2EE%2E%22">Riemer, D.E.</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: Proceedings, 39th Electronic Components Conference; 1989, p869-874, 6p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edb&AN=92343414
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/ECC.1989.77847
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 6
        StartPage: 869
    Titles:
      – TitleFull: Electrical equivalent method for thermal stress analysis.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Riemer, D.E.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 01
              Text: 1989
              Type: published
              Y: 1989
          Titles:
            – TitleFull: Proceedings, 39th Electronic Components Conference
              Type: main
ResultId 1