Natinsky, E., Khan, R. M., Wang, Q., Morris, D., Cullinan, M., & Dingreville, R. (2026). AFM-net: Machine learning acceleration of atomic force microscopy nanometrology from scarce data and fast scans. NPJ Computational Materials, 12(1), 1-13. https://doi.org/10.1038/s41524-026-02179-7
Παραπομπή σε μορφή Chicago (17η εκδ.)Natinsky, Eva, Ryan M. Khan, Qianshu Wang, David Morris, Michael Cullinan, και Rémi Dingreville. "AFM-net: Machine Learning Acceleration of Atomic Force Microscopy Nanometrology from Scarce Data and Fast Scans." NPJ Computational Materials 12, no. 1 (2026): 1-13. https://doi.org/10.1038/s41524-026-02179-7.
Παραπομπή σε μορφή MLA (9th εκδ.)Natinsky, Eva, et al. "AFM-net: Machine Learning Acceleration of Atomic Force Microscopy Nanometrology from Scarce Data and Fast Scans." NPJ Computational Materials, vol. 12, no. 1, 2026, pp. 1-13, https://doi.org/10.1038/s41524-026-02179-7.