Academic Journal
Kompaktowe stanowisko do symulacji i testowania układów scalonych.
| Τίτλος: | Kompaktowe stanowisko do symulacji i testowania układów scalonych. (Polish) |
|---|---|
| Alternate Title: | Compact integrated circuit simulation and test bench. (English) |
| Συγγραφείς: | JURCZAK, Mateusz, MARCHUT, Paulina, KOZIOŁ, Anna, MAJ, Piotr |
| Πηγή: | Przegląd Elektrotechniczny; 2026, Issue 7, p235-239, 5p |
| Θεματικοί όροι: | Test systems, Integrated circuits, Nuclear counters, Field programmable gate arrays, Simulation Program with Integrated Circuit Emphasis, Systems design, Hardware, Testing equipment |
| Abstract (English): | This paper introduces a design and development of a compact system for emulating and testing of integrated circuits. Test bench consists of myRIO device, PC with proper software and additional measurement devices. Test bench may be used for testing of integrated circuit emulated using FPGA. Architecture of the system allows for easy addition of new functionality. The test system was used to validate the design of a hybrid pixel radiation detector readout integrated circuit pre-production. [ABSTRACT FROM AUTHOR] |
| Abstract (Polish): | Przedstawiono projekt oraz realizację kompaktowego systemu do emulacji i testowania układów scalonych. Stanowisko oparte jest o urządzenie myRIO, komputer typu PC z odpowiednim oprogramowaniem oraz dodatkowe zewnętrzne urządzenia pomiarowe. Stanowisko może wykorzystywać emulator układu scalonego oparty na układzie FPGA. Architektura systemu pozwala na jego łatwe rozszerzanie o nowe funkcjonalności. System testowy został zastosowany do przedprodukcyjnego przetestowania projektu systemu odczytowego hybrydowego pikselowego detektora promieniowania rentgenowskiego. [ABSTRACT FROM AUTHOR] |
| Copyright of Przegląd Elektrotechniczny is the property of Wydawnictwo SIGMA-NOT and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Βάση Δεδομένων: | Complementary Index |
| FullText | Text: Availability: 0 |
|---|---|
| Header | DbId: edb DbLabel: Complementary Index An: 195752828 RelevancyScore: 1082 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 1082.42175292969 |
| IllustrationInfo | |
| Items | – Name: Title Label: Title Group: Ti Data: Kompaktowe stanowisko do symulacji i testowania układów scalonych. (Polish) – Name: TitleAlt Label: Alternate Title Group: TiAlt Data: Compact integrated circuit simulation and test bench. (English) – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22JURCZAK%2C+Mateusz%22">JURCZAK, Mateusz</searchLink><br /><searchLink fieldCode="AR" term="%22MARCHUT%2C+Paulina%22">MARCHUT, Paulina</searchLink><br /><searchLink fieldCode="AR" term="%22KOZIOŁ%2C+Anna%22">KOZIOŁ, Anna</searchLink><br /><searchLink fieldCode="AR" term="%22MAJ%2C+Piotr%22">MAJ, Piotr</searchLink> – Name: TitleSource Label: Source Group: Src Data: Przegląd Elektrotechniczny; 2026, Issue 7, p235-239, 5p – Name: Subject Label: Subject Terms Group: Su Data: <searchLink fieldCode="DE" term="%22Test+systems%22">Test systems</searchLink><br /><searchLink fieldCode="DE" term="%22Integrated+circuits%22">Integrated circuits</searchLink><br /><searchLink fieldCode="DE" term="%22Nuclear+counters%22">Nuclear counters</searchLink><br /><searchLink fieldCode="DE" term="%22Field+programmable+gate+arrays%22">Field programmable gate arrays</searchLink><br /><searchLink fieldCode="DE" term="%22Simulation+Program+with+Integrated+Circuit+Emphasis%22">Simulation Program with Integrated Circuit Emphasis</searchLink><br /><searchLink fieldCode="DE" term="%22Systems+design%22">Systems design</searchLink><br /><searchLink fieldCode="DE" term="%22Hardware%22">Hardware</searchLink><br /><searchLink fieldCode="DE" term="%22Testing+equipment%22">Testing equipment</searchLink> – Name: AbstractNonEng Label: Abstract (English) Group: Ab Data: This paper introduces a design and development of a compact system for emulating and testing of integrated circuits. Test bench consists of myRIO device, PC with proper software and additional measurement devices. Test bench may be used for testing of integrated circuit emulated using FPGA. Architecture of the system allows for easy addition of new functionality. The test system was used to validate the design of a hybrid pixel radiation detector readout integrated circuit pre-production. [ABSTRACT FROM AUTHOR] – Name: AbstractNonEng Label: Abstract (Polish) Group: Ab Data: Przedstawiono projekt oraz realizację kompaktowego systemu do emulacji i testowania układów scalonych. Stanowisko oparte jest o urządzenie myRIO, komputer typu PC z odpowiednim oprogramowaniem oraz dodatkowe zewnętrzne urządzenia pomiarowe. Stanowisko może wykorzystywać emulator układu scalonego oparty na układzie FPGA. Architektura systemu pozwala na jego łatwe rozszerzanie o nowe funkcjonalności. System testowy został zastosowany do przedprodukcyjnego przetestowania projektu systemu odczytowego hybrydowego pikselowego detektora promieniowania rentgenowskiego. [ABSTRACT FROM AUTHOR] – Name: Abstract Label: Group: Ab Data: <i>Copyright of Przegląd Elektrotechniczny is the property of Wydawnictwo SIGMA-NOT and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edb&AN=195752828 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.15199/48.2026.07.34 Languages: – Code: pol Text: Polish PhysicalDescription: Pagination: PageCount: 5 StartPage: 235 Subjects: – SubjectFull: Test systems Type: general – SubjectFull: Integrated circuits Type: general – SubjectFull: Nuclear counters Type: general – SubjectFull: Field programmable gate arrays Type: general – SubjectFull: Simulation Program with Integrated Circuit Emphasis Type: general – SubjectFull: Systems design Type: general – SubjectFull: Hardware Type: general – SubjectFull: Testing equipment Type: general Titles: – TitleFull: Kompaktowe stanowisko do symulacji i testowania układów scalonych. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: JURCZAK, Mateusz – PersonEntity: Name: NameFull: MARCHUT, Paulina – PersonEntity: Name: NameFull: KOZIOŁ, Anna – PersonEntity: Name: NameFull: MAJ, Piotr IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 07 Text: 2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 00332097 Numbering: – Type: issue Value: 7 Titles: – TitleFull: Przegląd Elektrotechniczny Type: main |
| ResultId | 1 |