Academic Journal

Optimizing Pi–Sigma Neural Networks for software defect prediction via correlation-based feature selection and robust evaluation.

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Optimizing Pi–Sigma Neural Networks for software defect prediction via correlation-based feature selection and robust evaluation.
Συγγραφείς: Ndahi, Barka Piyinkir, Abisoye, Opeyemi Aderiike, Ojerinde, Oluwaseun Adeniyi, Aliyu, Hamzat Olanrewaju
Πηγή: Bulletin of the National Research Centre; 7/27/2026, Vol. 50 Issue 1, p1-8, 8p
Θεματικοί όροι: Feature selection, Artificial neural networks, Defect tracking (Computer software development), Evaluation methodology, Model validation
Περίληψη: Software defect prediction is essential for maintaining code quality in critical domains, yet it remains challenging due to feature redundancy and class imbalance. This study proposes an optimized Pi–Sigma Neural Network (PSNN) framework leveraging Correlation-Based Feature Selection (CBFS) and Min-Max normalization. Utilizing the NASA PROMISE CM1 dataset, a 5-fold stratified cross-validation pipeline was implemented to ensure statistical robustness and prevent data leakage. Experimental results on the CM1 dataset show the refined PSNN achieves high performance (99.80% accuracy on CM1) after aggressive feature reduction to 3–5 features and a precision of 1.000. To address class imbalance, the model achieved a Matthews Correlation Coefficient (MCC) of 0.988 and a G-Mean of 0.990. Comparative analysis shows that the developed PSNN-FS, despite its simplicity, achieves strong performance competitive with more complex architectures on the CM1 dataset. [ABSTRACT FROM AUTHOR]
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Βάση Δεδομένων: Complementary Index
Περιγραφή
ISSN:25228307
DOI:10.1186/s42269-026-01453-4