Academic Journal
Relay Pursuit-Vathana: A Novel Optimization Approach for Feature Selection in Software Defect Prediction.
| Τίτλος: | Relay Pursuit-Vathana: A Novel Optimization Approach for Feature Selection in Software Defect Prediction. |
|---|---|
| Συγγραφείς: | M., Rajakani, R., Beaulah Jeyavathana, R. J., Kavitha |
| Πηγή: | Infocommunications Journal; Mar2026, Vol. 18 Issue 1, p2-10, 9p |
| Θεματικοί όροι: | Feature selection, Optimization algorithms, Defect tracking (Computer software development), Naive Bayes classification, Prediction models |
| Περίληψη: | Software defect prediction plays a crucial role in ensuring the quality and reliability of software systems. Feature selection, the process of identifying the most relevant features from a large set of potential features which is essential for building effective defect prediction models. In this paper, we propose a novel feature selection model based on the RelayPursuit-Vathana (RP-Vathana) optimization algorithm, inspired by relay races and pursuit dynamics in biological systems. The proposed model aims to identify an optimal subset of features for software defect prediction, maximizing the predictive performance of the resulting classification model. The RP-Vathana algorithm was integrated with a Naïve Bayes classifier and benchmarked on three datasets (PC5, JM1, KC2) to validate its effectiveness in feature selection for defect prediction. The results show that RP-Vathana significantly outperforms existing wrapper-based methods, obtaining mean accuracies of 94.28%, 93.69%, and 96.35% on PC5, JM1, and KC2, respectively, compared to the 83−90% range of rival techniques. While the parameter-free design improves usability, the algorithm's performance on highly noisy or very small datasets warrants future investigation into hybrid extensions for enhanced robustness. [ABSTRACT FROM AUTHOR] |
| Copyright of Infocommunications Journal is the property of Scientific Association for Infocommunications and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Βάση Δεδομένων: | Complementary Index |
| FullText | Text: Availability: 0 |
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| Header | DbId: edb DbLabel: Complementary Index An: 194189865 RelevancyScore: 1061 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 1060.7568359375 |
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| Items | – Name: Title Label: Title Group: Ti Data: Relay Pursuit-Vathana: A Novel Optimization Approach for Feature Selection in Software Defect Prediction. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22M%2E%2C+Rajakani%22">M., Rajakani</searchLink><br /><searchLink fieldCode="AR" term="%22R%2E%2C+Beaulah+Jeyavathana%22">R., Beaulah Jeyavathana</searchLink><br /><searchLink fieldCode="AR" term="%22R%2E+J%2E%2C+Kavitha%22">R. J., Kavitha</searchLink> – Name: TitleSource Label: Source Group: Src Data: Infocommunications Journal; Mar2026, Vol. 18 Issue 1, p2-10, 9p – Name: Subject Label: Subject Terms Group: Su Data: <searchLink fieldCode="DE" term="%22Feature+selection%22">Feature selection</searchLink><br /><searchLink fieldCode="DE" term="%22Optimization+algorithms%22">Optimization algorithms</searchLink><br /><searchLink fieldCode="DE" term="%22Defect+tracking+%28Computer+software+development%29%22">Defect tracking (Computer software development)</searchLink><br /><searchLink fieldCode="DE" term="%22Naive+Bayes+classification%22">Naive Bayes classification</searchLink><br /><searchLink fieldCode="DE" term="%22Prediction+models%22">Prediction models</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Software defect prediction plays a crucial role in ensuring the quality and reliability of software systems. Feature selection, the process of identifying the most relevant features from a large set of potential features which is essential for building effective defect prediction models. In this paper, we propose a novel feature selection model based on the RelayPursuit-Vathana (RP-Vathana) optimization algorithm, inspired by relay races and pursuit dynamics in biological systems. The proposed model aims to identify an optimal subset of features for software defect prediction, maximizing the predictive performance of the resulting classification model. The RP-Vathana algorithm was integrated with a Naïve Bayes classifier and benchmarked on three datasets (PC5, JM1, KC2) to validate its effectiveness in feature selection for defect prediction. The results show that RP-Vathana significantly outperforms existing wrapper-based methods, obtaining mean accuracies of 94.28%, 93.69%, and 96.35% on PC5, JM1, and KC2, respectively, compared to the 83−90% range of rival techniques. While the parameter-free design improves usability, the algorithm's performance on highly noisy or very small datasets warrants future investigation into hybrid extensions for enhanced robustness. [ABSTRACT FROM AUTHOR] – Name: Abstract Label: Group: Ab Data: <i>Copyright of Infocommunications Journal is the property of Scientific Association for Infocommunications and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.36244/ICJ.2026.1.1 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 9 StartPage: 2 Subjects: – SubjectFull: Feature selection Type: general – SubjectFull: Optimization algorithms Type: general – SubjectFull: Defect tracking (Computer software development) Type: general – SubjectFull: Naive Bayes classification Type: general – SubjectFull: Prediction models Type: general Titles: – TitleFull: Relay Pursuit-Vathana: A Novel Optimization Approach for Feature Selection in Software Defect Prediction. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: M., Rajakani – PersonEntity: Name: NameFull: R., Beaulah Jeyavathana – PersonEntity: Name: NameFull: R. J., Kavitha IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 03 Text: Mar2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 20612079 Numbering: – Type: volume Value: 18 – Type: issue Value: 1 Titles: – TitleFull: Infocommunications Journal Type: main |
| ResultId | 1 |