Academic Journal
High-Resolution Measurement of Surface Normal Maps Using Specular Reflection Imaging.
| Τίτλος: | High-Resolution Measurement of Surface Normal Maps Using Specular Reflection Imaging. |
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| Συγγραφείς: | Inoue, Shinichi, Igarashi, Yoshinori, Suzuki, Seiji |
| Πηγή: | Journal of Imaging; Apr2026, Vol. 12 Issue 4, p164, 14p |
| Θεματικοί όροι: | Surface geometry, Angular measurements, Surface properties, Data visualization, Inspection & review |
| Περίληψη: | This paper presents a method for measuring the spatial distribution of surface normal vectors with high angular accuracy. The measured data are visualized using a color-mapping technique and represented as normal maps, which are commonly used in computer graphics. Reliable methods for evaluating material surface properties have long been sought in industrial applications where visual assessments of reflective properties are still widely employed, particularly in appearance-critical fields. Motivated by this need, we introduce an imaging-based technique for measuring the high-resolution spatial distribution of surface normal vectors from specular reflection. A dedicated measurement apparatus was developed to capture surface normal vectors at 1024 × 1024 sampling points with a spatial resolution of 0.02 × 0.02 mm and an angular resolution of approximately 0.1°. Using this apparatus, normal maps were obtained for various materials, including plastic, ceramic tile, inkjet paper, and aluminum sheets. The spatial distribution of surface normal vectors reflects surface roughness, which strongly influences perceived texture. The resulting normal maps enable not only quantitative surface analysis for industrial inspection but also the physical reproduction of gloss in computer graphics. [ABSTRACT FROM AUTHOR] |
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| Βάση Δεδομένων: | Complementary Index |
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