Academic Journal
High-Resolution Measurement of Surface Normal Maps Using Specular Reflection Imaging.
| Τίτλος: | High-Resolution Measurement of Surface Normal Maps Using Specular Reflection Imaging. |
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| Συγγραφείς: | Inoue, Shinichi, Igarashi, Yoshinori, Suzuki, Seiji |
| Πηγή: | Journal of Imaging; Apr2026, Vol. 12 Issue 4, p164, 14p |
| Θεματικοί όροι: | Surface geometry, Angular measurements, Surface properties, Data visualization, Inspection & review |
| Περίληψη: | This paper presents a method for measuring the spatial distribution of surface normal vectors with high angular accuracy. The measured data are visualized using a color-mapping technique and represented as normal maps, which are commonly used in computer graphics. Reliable methods for evaluating material surface properties have long been sought in industrial applications where visual assessments of reflective properties are still widely employed, particularly in appearance-critical fields. Motivated by this need, we introduce an imaging-based technique for measuring the high-resolution spatial distribution of surface normal vectors from specular reflection. A dedicated measurement apparatus was developed to capture surface normal vectors at 1024 × 1024 sampling points with a spatial resolution of 0.02 × 0.02 mm and an angular resolution of approximately 0.1°. Using this apparatus, normal maps were obtained for various materials, including plastic, ceramic tile, inkjet paper, and aluminum sheets. The spatial distribution of surface normal vectors reflects surface roughness, which strongly influences perceived texture. The resulting normal maps enable not only quantitative surface analysis for industrial inspection but also the physical reproduction of gloss in computer graphics. [ABSTRACT FROM AUTHOR] |
| Copyright of Journal of Imaging is the property of MDPI and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Βάση Δεδομένων: | Complementary Index |
| FullText | Text: Availability: 0 CustomLinks: – Url: https://resolver.ebsco.com/c/fiv2js/result?sid=EBSCO:edb&genre=article&issn=2313433X&ISBN=&volume=12&issue=4&date=20260401&spage=164&pages=164-177&title=Journal of Imaging&atitle=High-Resolution%20Measurement%20of%20Surface%20Normal%20Maps%20Using%20Specular%20Reflection%20Imaging.&aulast=Inoue%2C%20Shinichi&id=DOI:10.3390/jimaging12040164 Name: Full Text Finder (for New FTF UI) (ns324271) Category: fullText Text: Full Text Finder MouseOverText: Full Text Finder |
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| Items | – Name: Title Label: Title Group: Ti Data: High-Resolution Measurement of Surface Normal Maps Using Specular Reflection Imaging. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Inoue%2C+Shinichi%22">Inoue, Shinichi</searchLink><br /><searchLink fieldCode="AR" term="%22Igarashi%2C+Yoshinori%22">Igarashi, Yoshinori</searchLink><br /><searchLink fieldCode="AR" term="%22Suzuki%2C+Seiji%22">Suzuki, Seiji</searchLink> – Name: TitleSource Label: Source Group: Src Data: Journal of Imaging; Apr2026, Vol. 12 Issue 4, p164, 14p – Name: Subject Label: Subject Terms Group: Su Data: <searchLink fieldCode="DE" term="%22Surface+geometry%22">Surface geometry</searchLink><br /><searchLink fieldCode="DE" term="%22Angular+measurements%22">Angular measurements</searchLink><br /><searchLink fieldCode="DE" term="%22Surface+properties%22">Surface properties</searchLink><br /><searchLink fieldCode="DE" term="%22Data+visualization%22">Data visualization</searchLink><br /><searchLink fieldCode="DE" term="%22Inspection+%26+review%22">Inspection & review</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: This paper presents a method for measuring the spatial distribution of surface normal vectors with high angular accuracy. The measured data are visualized using a color-mapping technique and represented as normal maps, which are commonly used in computer graphics. Reliable methods for evaluating material surface properties have long been sought in industrial applications where visual assessments of reflective properties are still widely employed, particularly in appearance-critical fields. Motivated by this need, we introduce an imaging-based technique for measuring the high-resolution spatial distribution of surface normal vectors from specular reflection. A dedicated measurement apparatus was developed to capture surface normal vectors at 1024 × 1024 sampling points with a spatial resolution of 0.02 × 0.02 mm and an angular resolution of approximately 0.1°. Using this apparatus, normal maps were obtained for various materials, including plastic, ceramic tile, inkjet paper, and aluminum sheets. The spatial distribution of surface normal vectors reflects surface roughness, which strongly influences perceived texture. The resulting normal maps enable not only quantitative surface analysis for industrial inspection but also the physical reproduction of gloss in computer graphics. [ABSTRACT FROM AUTHOR] – Name: Abstract Label: Group: Ab Data: <i>Copyright of Journal of Imaging is the property of MDPI and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.3390/jimaging12040164 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 14 StartPage: 164 Subjects: – SubjectFull: Surface geometry Type: general – SubjectFull: Angular measurements Type: general – SubjectFull: Surface properties Type: general – SubjectFull: Data visualization Type: general – SubjectFull: Inspection & review Type: general Titles: – TitleFull: High-Resolution Measurement of Surface Normal Maps Using Specular Reflection Imaging. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Inoue, Shinichi – PersonEntity: Name: NameFull: Igarashi, Yoshinori – PersonEntity: Name: NameFull: Suzuki, Seiji IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 04 Text: Apr2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 2313433X Numbering: – Type: volume Value: 12 – Type: issue Value: 4 Titles: – TitleFull: Journal of Imaging Type: main |
| ResultId | 1 |