Inoue, S., Igarashi, Y., & Suzuki, S. (2026). High-Resolution Measurement of Surface Normal Maps Using Specular Reflection Imaging. Journal of Imaging, 12(4), 164-177. https://doi.org/10.3390/jimaging12040164
Παραπομπή σε μορφή Chicago (17η εκδ.)Inoue, Shinichi, Yoshinori Igarashi, και Seiji Suzuki. "High-Resolution Measurement of Surface Normal Maps Using Specular Reflection Imaging." Journal of Imaging 12, no. 4 (2026): 164-177. https://doi.org/10.3390/jimaging12040164.
Παραπομπή σε μορφή MLA (9th εκδ.)Inoue, Shinichi, et al. "High-Resolution Measurement of Surface Normal Maps Using Specular Reflection Imaging." Journal of Imaging, vol. 12, no. 4, 2026, pp. 164-177, https://doi.org/10.3390/jimaging12040164.
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